ADuM4137單路IGBT柵極驅(qū)動解決方案

ADI公司的ADuM4137是單路IGBT柵極驅(qū)動器，采用ADI的iCoupler?技術(shù)，使得輸入信號和輸出柵驅(qū)動之間絕緣。器件還對過流，遙控溫度過熱，欠壓鎖?。║VLO）和熱關(guān)斷（TSD）等事件提供故障報告。峰值驅(qū)動輸出6A，NFET內(nèi)部關(guān)斷時開態(tài)電阻小于0.95Ω，PFET關(guān)斷時開態(tài)電阻小于1.18Ω，上升傳輸時延105ns，下降傳輸時延107ns，最小脈沖寬度70ns，工作結(jié)溫范圍為?40℃到+150℃，滿足汽車應(yīng)用AEC-Q100規(guī)范，主要用在MOSFET/IGBT柵極驅(qū)動器，光伏（PV）逆變器，馬達驅(qū)動和電源。本文介紹了ADuM4137主要特性，功能框圖，IGBT驅(qū)動應(yīng)用案例電路以及評估板EVAL-ADuM4137EBZ主要特性，電路圖，材料清單和PCB設(shè)計圖。

The ADuM41371 is a single-channel gate driver specifically optimized for driving insulated gate bipolar transistors （IGBTs）。 Analog Devices， Inc.， iCoupler? technology provides isolation between the input signal and the output gate drive.

The Analog Devices chip scale transformers also provide isolated communication of control information between the high voltage and low voltage domains of the chip. Information on the status of the chip can be read back from the dedicated fault outputs. The ADuM4137 provides isolated fault reporting for overcurrent events， remote temperature overheating events， undervoltage lockout （UVLO）， and thermal shutdown （TSD）。

Integrated onto the ADuM4137 is an overcurrent detection feature that protects the IGBT in case of overcurrent events. The split emitter overcurrent detection is coupled with a high speed， two-level turn off in case of faults.

The ADuM4137 provides a Miller clamp control signal for the external metal-oxide semiconductor field effect transistor （MOSFET） to provide robust IGBT turn off with a single rail supply when the gate voltage drops below 2.0 V （typical） and above GND2. Operation with unipolar secondary supplies is possible， with or without the Miller clamp operation.

A low gate voltage detection circuit can trigger a fault if the gate voltage does not go above the internal threshold （VDVL） within the time allowed from turn on （tDVL）。 This circuit allows detection of IGBT device failures that exhibit gate shorts or other causes of weak drive.

The secondary falling UVLO is set to 11.24 V （typical） for common IGBT two-level plateau voltage levels.

The ADuM4137 provides for in field programming of temperature. Two temperature sensor pins allow isolated monitoring of system temperatures at the IGBTs， sensing diode gains and offsets by means of a serial port interface （SPI） bus on the primary side of the device. Values are stored on an EEPROM located on the secondary side. Additionally， programming is available for specific voltage offsets， temperature sensing reporting frequencies， and important delays.

The ASC pin on the secondary side on the ADuM4137 allows the driver to be switched on from the secondary side if no faults are present.

ADuM4137主要特性：

6 A peak drive output capability

Internal turn off NFET， on resistance： 《0.95 Ω

Internal turn on PFET， on resistance： 《1.18 Ω

Split emitter overcurrent detection

Miller clamp output with gate sense input

Isolated fault output

Isolated temperature sensor read back

Propagation delay

Rising： 105 ns typical

Falling： 107 ns typical

Minimum pulse width： 70 ns

Operating junction temperature range （?40℃ to +150℃）

VDD1 and VDD2 UVLO

ASC input

8.3 mm creepage distance

Safety and regulatory approvals

5 kV rms for 1 minute per UL 1577

CSA Component Acceptance Notice 5A

DIN V VDE V 0884-10 （VDE V 0884-10）：2006-12

VIORM = 849 VPEAK （reinforced/basic）

AEC-Q100 qualified for automotive applications

ADuM4137應(yīng)用：

MOSFET/IGBT gate drivers

Photovoltaic （PV） inverters

Motor drives

Power supplies

圖1.ADuM4137功能框圖

圖2.ADuM4137 IGBT驅(qū)動應(yīng)用案例電路

評估板EVAL-ADuM4137EBZ

The EVAL-ADuM4137EBZ board demonstrates the advanced features of the ADuM4137 while maintaining flexibility in a testing environment. The EVAL-ADuM4137EBZ board layout delivers a circuit that is easy to manipulate via jumper pins. A more optimized layout is possible and increases the performance of the system.

The EVAL-ADuM4137EBZ board works with the USB-SDP-CABLEZ programming cable to access the secondary side electronically erasable programmable read only memory （EEPROM） and includes the option to drive the serial peripheral interface （SPI） bus with any other SPI compatible system. The USB-SDP-CABLEZ operates with a 3.3 V logic supply， while the ADuM4137 has an internal 5 V regulator. A resistor divider on the MISO line is included in the R21 and R22 resistors to allow interfacing.

This guide demonstrates how to use the ADuM4137 evaluation software for accessing the user trim bits and explains how to simulate EEPROM settings and program bits into nonvolatile memory.

For full details on the ADuM4137， see the ADuM4137 data sheet， which should be consulted in conjunction with this user guide when using this evaluation board.

評估板EVAL-ADuM4137EBZ主要特性：

6 A peak drive output capability

Output power device resistance： 《1 Ω

Test infrastructure for

SPI communication

Miller clamp

Desaturation detection

Two overcurrent protection pins

Two temperature sensor pins

Fault reporting

Two dummy loads

圖3.評估板EVAL-ADuM4137EBZ外形圖

圖4.評估板EVAL-ADuM4137EBZ電路圖

評估板EVAL-ADuM4137EBZ材料清單：

圖5.評估板EVAL-ADuM4137EBZ PCB設(shè)計圖：頂層

圖6.評估板EVAL-ADuM4137EBZ PCB設(shè)計圖：底層